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Communication Dans Un Congrès Année : 2015

A Novel Analytical Method for Defect Tolerance Assessment

Résumé

Due to technology downscaling, defect tolerance analysis has become a major concern in the design of digital circuits. In this paper, we present a novel analytical method that calculates the defect tolerance of logic circuits using probabilistic defect propagation. The proposed method is explained in case of single defect model, but can be easily adapted to handle multiple fault scenarios. The approach manages signal dependencies due to reconvergent fanouts and provides accurate results while keeping linear complexity.

Domaines

Electronique
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Dates et versions

hal-01216726 , version 1 (16-10-2015)

Identifiants

  • HAL Id : hal-01216726 , version 1

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Mariem Slimani, Arwa Ben Dhia, Lirida Naviner. A Novel Analytical Method for Defect Tolerance Assessment. European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France. ⟨hal-01216726⟩
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