Signal Probability, Reliability and Error Bound of Majority Voter in TMR

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Tian Ban, Lirida Alves de Barros Naviner. Signal Probability, Reliability and Error Bound of Majority Voter in TMR. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States. ⟨hal-02286333⟩

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