Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini 1, 2 Lirida Alves de Barros Naviner 1, 2 Jean-François Naviner 3
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
3 LTCI - Laboratoire Traitement et Communication de l'Information
Document type :
Conference papers
Complete list of metadatas
https://hal.telecom-paristech.fr/hal-02286459
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:46:50 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

Identifiers

  • HAL Id : hal-02286459, version 1

Collections

LTCI | CNRS | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH

Citation

Samuel Nascimento Pagliarini, Lirida Alves de Barros Naviner, Jean-François Naviner. Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening. European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France. ⟨hal-02286459⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

6

Contact

Informations

CCSD