Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini; Lirida Alves de Barros Naviner; Jean-François Naviner

Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

Samuel Nascimento Pagliarini ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2} Jean-François Naviner ³

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

3 LTCI - Laboratoire Traitement et Communication de l'Information

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Engineering Sciences [physics] / Electronics

Complete list of metadatas

https://hal.telecom-paristech.fr/hal-02286459
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:46:50 PM
Last modification on : Saturday, September 14, 2019 - 1:39:53 AM

Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

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Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

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