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Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening
Samuel Nascimento Pagliarini 1, 2
Author
Lirida Alves de Barros Naviner 1, 2
Author
Jean-François Naviner 3
Author
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
3
LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5141 (France)
Document type :
Conference papers
Complete list of metadatas
https://hal.telecom-paristech.fr/hal-02286459
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:46:50 PM
Last modification on : Thursday, March 5, 2020 - 4:02:44 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:46:50 PM
Last modification on : Thursday, March 5, 2020 - 4:02:44 PM
Identifiers
- HAL Id : hal-02286459, version 1
Citation
Samuel Nascimento Pagliarini, Lirida Alves de Barros Naviner, Jean-François Naviner. Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening. European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France. ⟨hal-02286459⟩
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