Electric Probes for Fault Injection Attack

Laurent Sauvage 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract :

Extracting secret information from an integrated circuit by disturbing it with an electromagnetic (EM) pulse has a growing interest. The success of such a process depends directly on the EM probes used. In this paper, we present the results of the experimental characterization of three electric probes, through their bandwidth and opening width. Strangely, the probe specifically designed to inject high power EM fields turns out to be the least efficient. Another, handmade, transfers only very low power to its victim. The latter is very satisfactory, but only in a preferred direction.

Document type :
Conference papers
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https://hal.telecom-paristech.fr/hal-02286766
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:09:43 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02286766, version 1

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Laurent Sauvage. Electric Probes for Fault Injection Attack. APEMC, Aug 2013, Melbourne, Australia. ⟨hal-02286766⟩

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