Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu 1, 2 Hao Cai 1, 2 Ting An 1, 2 Lirida Alves de Barros Naviner 1, 2 Jean-François Naviner Hervé Petit 3, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
3 C2S - Circuits et Systèmes de Communication
LTCI - Laboratoire Traitement et Communication de l'Information
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https://hal.telecom-paristech.fr/hal-02286814
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Submitted on : Friday, September 13, 2019 - 4:13:30 PM
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  • HAL Id : hal-02286814, version 1

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Kaikai Liu, Hao Cai, Ting An, Lirida Alves de Barros Naviner, Jean-François Naviner, et al.. Reliability analysis of combinational circuits with the influences of noise and single-event transients. IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States. ⟨hal-02286814⟩

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