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Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩