Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

Yu-Ichi Hayashi Naofumi Homma 1, 2 Takaaki Mizuki Takafumi Aoki Hideaki Sone Laurent Sauvage 1, 2 Jean-Luc Danger 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
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Journal articles
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https://hal.telecom-paristech.fr/hal-02286819
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02286819, version 1

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LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH

Citation

Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩

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