Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An 1, 2 Kaikai Liu 1, 2 Lirida Alves de Barros Naviner 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
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https://hal.telecom-paristech.fr/hal-02286867
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Submitted on : Friday, September 13, 2019 - 4:17:49 PM
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Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02286867⟩

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