Statistical analysis of harmonic distortion in a differential bootstrapped sample and hold circuit

Abstract :

The bootstrap technique is known to increase the linearity of Sample and Hold (S/H) circuit by reducing the input signal dependency of the transistor-switch resistance. But some nonlinearities remain due to parasitic capacitances, mobility degradation and back gate effect resulting in a second order harmonic spurious which can be reduced with a differential architecture. However mismatch between channels limits this technique. In this paper, we provide a general framework to analyze the residual nonlinearity in bootstrapped S/H. Statistical laws are also provided converting harmonic distortion specifications into matching requirements for differential sampling and therefore provide key rules for S/H designers.

Document type :
Conference papers
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Submitted on : Friday, September 13, 2019 - 4:24:01 PM
Last modification on : Thursday, October 17, 2019 - 12:36:59 PM

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Citation

Gael Kamdem de Teyou, Hervé Petit, P. Loumeau, H. Fakhoury. Statistical analysis of harmonic distortion in a differential bootstrapped sample and hold circuit. IEEE Microelectronics and Electronics conference(PRIME), 2014, Jun 2014, Grenoble, France. ⟨10.1109/PRIME.2014.6872726⟩. ⟨hal-02286955⟩

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