Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

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https://hal.telecom-paristech.fr/hal-02287224
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:44:36 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287224, version 1

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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology. Microelectronics Reliability, 2015. ⟨hal-02287224⟩

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