A Model-Based Testing Process for Enhancing Structural Coverage in Functional Testing

Yanjun Sun 1, 2 Gérard Memmi 1, 2 Sylvie Vignes 1, 2
1 ACES - Autonomic and Critical Embedded Systems
LTCI - Laboratoire Traitement et Communication de l'Information
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Conference papers
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https://hal.telecom-paristech.fr/hal-02287374
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Submitted on : Friday, September 13, 2019 - 4:54:32 PM
Last modification on : Thursday, October 17, 2019 - 12:36:59 PM

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  • HAL Id : hal-02287374, version 1

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Yanjun Sun, Gérard Memmi, Sylvie Vignes. A Model-Based Testing Process for Enhancing Structural Coverage in Functional Testing. Int. Conf. CSDM Asia, Feb 2016, Singapore, Singapore. pp.171-180. ⟨hal-02287374⟩

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