Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters

Mariem Slimani 1, 2 Lirida Alves de Barros Naviner 1, 2 You Wang 1, 2 Hao Cai 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract :

Majority voters are typically used in redundancy hardening techniques aiming to increase the reliability of nanoscale circuits. Besides, Spin Transfer Torque Magnetic Tunnel Junction (STT-MJT) has been identified as the most promising candidate for low power and high speed applications. In this paper, we present two majority voter circuits based on nanometer STT-MTJ. By using STMicroelectronics FDSOI 28 nm process and a precise STT-MTJ compact model, electrical simulations have been carried out to compare their performances and analyze their reliability. Both radiation sensitivity and variability have been investigated in the reliability-aware analysis.

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https://hal.telecom-paristech.fr/hal-02287469
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Submitted on : Friday, September 13, 2019 - 4:59:42 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287469, version 1

Citation

Mariem Slimani, Lirida Alves de Barros Naviner, You Wang, Hao Cai. Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters. Microelectronics Reliability, 2016, C (64), pp.48-53. ⟨hal-02287469⟩

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