Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

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Submitted on : Friday, September 13, 2019 - 4:59:48 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287471, version 1

Citation

Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology. IEEE Transactions on Device and Materials Reliability, 2016, 16 (3), pp.376-383. ⟨hal-02287471⟩

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