Efficient reliability evaluation methodologies for combinational circuits

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https://hal.telecom-paristech.fr/hal-02287474
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Submitted on : Friday, September 13, 2019 - 4:59:52 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287474, version 1

Citation

Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner, You Wang, Mariem Slimani, et al.. Efficient reliability evaluation methodologies for combinational circuits. Microelectronics Reliability, 2016, 64. ⟨hal-02287474⟩

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