Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

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Submitted on : Friday, September 13, 2019 - 5:27:59 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287890, version 1

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Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, F. Abouzeid, et al.. Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test. Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States. ⟨hal-02287890⟩

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