Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

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https://hal.telecom-paristech.fr/hal-02287982
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:33:46 PM
Last modification on : Thursday, October 17, 2019 - 12:37:03 PM

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  • HAL Id : hal-02287982, version 1

Citation

Nilson Maciel, Elaine Crespo Marques, Lirida Alves de Barros Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology. Microelectronics Reliability, 2018, 88-90, pp.965-968. ⟨hal-02287982⟩

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