Parametric Statistical Modeling of Power Gain Patterns for RFID Backscattering Channels

Abstract :

We describe a statistical model of the power gain patterns of a set of planar antennas, randomly generated from a starting parameterized design. It is first based on a spherical harmonics and double Fourier series expansion for each antenna pattern, followed by the statistical model of the expansion coefficients over the full set. This double compression method results in only a few tens of parameters to reconstruct all patterns. The method fails at the poles when it is applied to a polarization component of the pattern but this does not appear to be a critical problem.

Document type :
Conference papers
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https://hal.telecom-paristech.fr/hal-02288332
Contributor : Telecomparis Hal <>
Submitted on : Saturday, September 14, 2019 - 6:41:56 PM
Last modification on : Sunday, September 15, 2019 - 1:22:37 AM

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  • HAL Id : hal-02288332, version 1

Citation

Zeinab Mhanna, Alain Sibille, Muhammad Amir Yousuf, C. Roblin. Parametric Statistical Modeling of Power Gain Patterns for RFID Backscattering Channels. European Conference on Antennas & propagation, Mar 2012, Prague, Czech Republic. pp.1041 -1045. ⟨hal-02288332⟩

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