A novel simulation approach for fault injection resistance evaluation on smart cards

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https://hal.telecom-paristech.fr/hal-02412312
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Submitted on : Sunday, December 15, 2019 - 12:56:32 PM
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Lionel Rivière, Julien Bringer, Thanh-Ha Le, Hervé Chabanne. A novel simulation approach for fault injection resistance evaluation on smart cards. Eighth IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 Workshops, Graz, Austria, April 13-17, 2015, 2015, Graz, Austria. pp.1-8, ⟨10.1109/ICSTW.2015.7107460⟩. ⟨hal-02412312⟩

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